IMI Interdisciplinary Mathematics InstituteCollege of Arts and Sciences

Aberration Correction and Compensation in Electron Microscopy: Applications to Quantitative Imaging of Nanostructures

  • March 24, 2009
  • 3:30 p.m.
  • Sumwalt 102


Electron-optical aberration correctors are now firmly established as a key component in many commercial Transmission and Scanning Transmission Electron Microscopes installed worldwide. Algorithms that recover the complex specimen exit plane wavefunction from a series of images recorded using one of several possible experimental geometries (including focal and tilt series) have also advanced to the point where several commercial software implementations utilizing this approach are readily available. This paper will discuss the use of combinations of direct aberration correction and exit wave reconstruction with particular reference to the characterisation of surface morphology in metal and metal oxide nanoparticles and to general improvements in quantitative imaging at atomic resolution.

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