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# Imaging in Electron Microscopy II

### February 18 - 23, 2010

**Daily: 9:30 AM - 4:30 PM**

**University of South Carolina**

**Columbia, SC 29208**

The Interdisciplinary Mathematics Institute (IMI) and the NanoCenter are pleased to announce a special research workshop on Imaging in Electron Microscopy from February 18-23, 2010. This intensive workshop consists of 16 lectures and 4 discussion sessions held over a six day period, and will bring together specialists in electron microscopy, image science, materials science, computational science, and mathematics to identify current obstacles and problems in the field that have the potential to be resolved by emerging mathematical methods.

The workshop is part of the third annual research seminar hosted by the IMI during the period from mid February to mid April. While the first seminar had a methodological focus on emerging concepts in “Mathematical Learning Theory in High Dimensions” the second seminar was held in close collaboration with the NanoCenter focusing on new imaging concepts for electron microscopy. In fact, recent advances in hardware-based aberration correction have significantly expanded the nanoscale direct imaging capabilities of scanning transmission electron microscopes (STEM). These instrumental advances are beginning to radically transform the imaging of nanoscale matter and in the near future will provide huge opportunities for the investigation of biological structures. However, severe bottlenecks of these techniques are the manual operation and labor intense search procedures, the damage due to the electron beam and the extreme environmental sensitivity of the instruments. One focus point of the seminar is to tackle these scientific challenges, for instance, by formulating and exploring a new mathematical model to treat a collection of electron microscopy scans of two-dimensional projections which will facilitate the extraction of high-resolution images from low-resolution/low-energy scans. The results of last year’s seminar and this year’s workshop will be part of the springer book “Nano-scale Imaging in Electron Microscopy” in Springer's Nanostructure Science & Technology Series. At this stage the workshop will provide an excellent opportunity to learn from experts in essentially all relevant fields and to coordinate future research in the area.