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New Frontiers in Imaging and Sensing

February 17 - 22, 2011

Daily: 9:00 AM - 5:00 PM
University of South Carolina
Columbia, SC 29208


The Interdisciplinary Mathematics Institute (IMI) and the NanoCenter are pleased to announce a special research workshop scheduled for February 17 – 22, 2011. As the second event of this type, the workshop is a focus point of our ongoing collaboration in developing new imaging methods for electron microscopy, this time with special emphasis on sparsity recovering and compressed sensing concepts. Accordingly, the scope of applications will be widened to other data acquisition methods of high current interest in and outside the university such as Synthetic Aperture Radar (SAR) and tomography related image formation. This interactive workshop will bring together experts in relevant areas from material science, microscopy, sensor systems, mathematics and computer science to identify current obstacles and problems in the field that have the potential to be resolved by emerging mathematical methods. We expect to have 23 lectures and 5 discussion sessions spread over a six day period. Especially, there is ample space for discussions as it has proven very effective in the past in triggering synergies between application aspects and novel methodological developments.

The workshop is part of the fourth annual research seminar hosted by the IMI during the period from mid February to mid April. While the first seminar had a methodological focus on emerging concepts in “Mathematical Learning Theory in High Dimensions” the second seminar was held in close collaboration with the NanoCenter focusing on new imaging concepts for electron microscopy. In fact, recent advances in hardware-based aberration correction have significantly expanded the nanoscale direct imaging capabilities of scanning transmission electron microscopes (STEM). These instrumental advances are beginning to radically transform the imaging of nanoscale matter and in the near future will provide huge opportunities for the investigation of biological structures. However, severe bottlenecks of these techniques are the manual operation and labor intense search procedures, the damage due to the electron beam and the extreme environmental sensitivity of the instruments. One focus point of the seminar is to tackle these scientific challenges, for instance, by formulating and exploring a new mathematical model to treat a collection of electron microscopy scans of two-dimensional projections which will facilitate the extraction of high-resolution images from low-resolution/low-energy scans. The results of the previous seminars and last year’s workshop will be part of the Springer book “Nano-scale Imaging in Electron Microscopy” in Springer's Nanostructure Science & Technology Series. At this stage the workshop will provide an excellent opportunity to learn from experts in essentially all relevant fields in the above widened scope of applications and to coordinate future research in the area.

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